US PATENT SUBCLASS 702 / 36
.~.~.~ Location

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
33  DF  .~ Mechanical measurement system {6}
35  DF  .~.~ Flaw or defect detection {4}
36.~.~.~ Location

DEFINITION

Classification: 702/36

Location:

(under subclass 35) Subject matter comprising means for determining position or site of the fault.

SEE OR SEARCH THIS CLASS, SUBCLASS:

59, for determination of an electrical fault location.