US PATENT SUBCLASS 702 / FOR 109
.~.~.~ Pulse (364/486)
Current as of:
June, 1999
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702 /
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DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING
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DD
APPLICATIONS (364/400)
{1}
FOR 103
DF
.~ Electrical/electronic engineering (364/480) {1}
FOR 104
DF
.~.~ Measuring or testing (364/481) {5}
FOR 109
.~.~.~ Pulse (364/486)
DEFINITION
Classification: 702/FOR.109
Pulse:
Foreign art collections wherein the area includes measuring and testing of or for a value or parameter of the variation of a quantity characterized by a rise and decay of a finite duration.