US PATENT SUBCLASS 702 / FOR 148
.~.~.~.~ Width or thickness (364/563)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 141  DF  .~ For basic measurements (364/556) {8}
FOR 145  DF  .~.~ Dimension (364/560) {2}
FOR 146  DF  .~.~.~ Distance (364/561) {2}
FOR 148.~.~.~.~ Width or thickness (364/563)

DEFINITION

Classification: 702/FOR.148

Width or thickness:

Foreign art collections wherein the points lie in a line generally perpendicular to a reference surface.